Scanning thermal imaging of microelectronic circuits with a fluorescent nanoprobe | NobleID

Main

Mint Work Search Explore Works Knowledge Graph Citation Graph Bibliometrics Receipts

v1

Scanning thermal imaging of microelectronic circuits with a fluorescent nanoprobe

Identifier:nobleid.org/w1/20260524/91D4FBA6

Type:Journal Article

0 views

Support unavailableClaim Your Authorship

View Original Paper Source

Embeddable Badge

[![NobleID](https://www.nobleid.org/api/badge/91D4FBA6.svg?ark=w1%2F20260524%2F91D4FBA6)](https://nobleid.org/work/w1/20260524/91D4FBA6)

ARK Inflections

Metadata Policy

Metadata Formats

Bibliometric Analysis

Impact metrics, research fronts, co-authorship networks →

Authors & Claims

Paper Authors

Benoît Charlot

Claim authorship of this work

info@nobleid.org

About FAQ Terms Policy Persistence & Resolver Service Policy