On the universality of inversion layer mobility in Si MOSFET's: Part I-effects of substrate impurity concentration

v1

Type:Journal Article

0 views

[![NobleID](https://www.nobleid.org/api/badge/07DAB8EC.svg?ark=w1%2F20260526%2F07DAB8EC)](https://nobleid.org/work/w1/20260526/07DAB8EC)

ARK Inflections

Bibliometric Analysis

Impact metrics, research fronts, co-authorship networks →

Authors & Claims

Paper Authors