Investigation of traumatic brain injuries using the next generation of simulated injury monitor (SIMon) finite element head model.

Takhounts EG; Ridella SA; Hasija V; Tannous RE; Campbell JQ; Malone D; Danelson K; Stitzel J; Rowson S; Duma S

doi:10.4271/2008-22-0001

Investigation of traumatic brain injuries using the next generation of simulated injury monitor (SIMon) finite element head model.

Identifier:nobleid.org/w1/20260526/96F0C033

Type:Journal Article

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Investigation of traumatic brain injuries using the next generation of simulated injury monitor (SIMon) finite element head model.

Identifier:nobleid.org/w1/20260526/96F0C033

Type:Journal Article

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