High-speed probe card design to reduce the crosstalk noise for wafer-level test

Eunjung Lee; Man‐Ho Lee; Jonghoon Kim; Mijoo Kim; Jonghoon Kim; Joungho Kim; Jeoungkeun Park; Jong-Hyun Park; Yoonhee Bang; Il Kim

doi:10.1109/epeps.2014.7103610

High-speed probe card design to reduce the crosstalk noise for wafer-level test

Identifier:nobleid.org/w1/20260515/08CC9999

Type:Journal Article

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High-speed probe card design to reduce the crosstalk noise for wafer-level test

Identifier:nobleid.org/w1/20260515/08CC9999

Type:Journal Article

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