Optical detection of micro defect by single-pixel imaging | NobleID

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Optical detection of micro defect by single-pixel imaging

NobleID: NI2P52W51R48S93
Persistent link: https://nobleid.org/ark:/48914/w1/20260515/0EEFD592

Type:Journal Article

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Yasuhiro Mizutani

Hirotsugu Yamamoto

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