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Scaling effect on vertical gate-all-around FETs using III-V NW-channels on Si

Identifier:nobleid.org/w1/20260515/2AC01AB0

Type:Journal Article

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Katsuhiro Tomiok

Junichi Motohisa

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Scaling effect on vertical gate-all-around FETs using III-V NW-channels on Si | NobleID