The Electrical Characteristics of Metal-Oxide-Semiconductor Field Effect Transistors Fabricated on Cubic Silicon Carbide

Takeshi Ohshima; Kin Kiong Lee; Yuuki Ishida; Kazutoshi Kojima; Yasunori Tanaka; Tomoyuki Takahashi; Masahito Yoshikawa; Hajime Okumura; Kazuo Arai; Toshio Kamiya

doi:10.1143/jjap.42.l625

The Electrical Characteristics of Metal-Oxide-Semiconductor Field Effect Transistors Fabricated on Cubic Silicon Carbide

Identifier:nobleid.org/w1/20260515/2EB175D8

Type:Journal Article

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The Electrical Characteristics of Metal-Oxide-Semiconductor Field Effect Transistors Fabricated on Cubic Silicon Carbide

Identifier:nobleid.org/w1/20260515/2EB175D8

Type:Journal Article

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