Ion-beam analysis of phospholipid thin films deposited on c-Si | NobleID

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Ion-beam analysis of phospholipid thin films deposited on c-Si

NobleID: NI1P92W40R73S89
Persistent link: https://nobleid.org/ark:/48914/w1/20260515/34533FEC

Type:Journal Article

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Pinaki Gupta‐Bhaya

Satyendra Kumar

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