Optical and electrical characterization of defects in zinc oxide thin films grown by atomic layer deposition

T. Krajewski; G. Łuka; Ł. Wachnicki; R. Jakieła; B.S. Witkowski; E. Guziewicz; M. Godlewski; N. Huby; G. Tallarida

doi:10.1503/cmaj.060825

Optical and electrical characterization of defects in zinc oxide thin films grown by atomic layer deposition

Identifier:nobleid.org/w1/20260515/481005EB

Type:Journal Article

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Optical and electrical characterization of defects in zinc oxide thin films grown by atomic layer deposition

Identifier:nobleid.org/w1/20260515/481005EB

Type:Journal Article

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