X-Ray Diagnostics for Scuffing: Application to Phase Transformation in Nickel | NobleID

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X-Ray Diagnostics for Scuffing: Application to Phase Transformation in Nickel

Identifier:nobleid.org/w1/20260515/4FD87F97

Type:Journal Article

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Oyelayo O. Ajayi

Cinta Lorenzo-Martín

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