v1
Investigation of optimized Si<inf>1-x</inf>Ge<inf>x</inf> 3D-fin-TFET by varying the fin height
Identifier:nobleid.org/w1/20260515/548C9A5D
Type:Journal Article
0 views
Embeddable Badge
[](https://nobleid.org/work/w1/20260515/548C9A5D)
Bibliometric Analysis
Impact metrics, research fronts, co-authorship networks →
Authors & Claims