v1
A numerical investigation on effects of lateral Si/SiO2 interface traps on magnetic sensitivity of sectorial SD-MAGFET
Identifier:nobleid.org/w1/20260515/5B3FEF46
Type:Journal Article
0 views
Embeddable Badge
[](https://nobleid.org/work/w1/20260515/5B3FEF46)
Bibliometric Analysis
Impact metrics, research fronts, co-authorship networks →
Authors & Claims