Robust Hybrid TFET-MOSFET Circuits in Presence of Process Variations and Soft Errors | NobleID

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Robust Hybrid TFET-MOSFET Circuits in Presence of Process Variations and Soft Errors

Identifier:nobleid.org/w1/20260515/710C2F8F

Type:Journal Article

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Ali Afzali‐Kusha

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