Incremental Validity of Language-Based Assessments of Personality in World Trade Center Responders

Joshua R. Oltmanns; H. Andrew Schwartz; Camilo J. Ruggero; Youngseo Son; Huy Vu; Gilvir Gill; Jiaju Miao; Monika A. Waszczuk; Sean Clouston; Evelyn J. Bromet

doi:10.31234/osf.io/7graf_v1

Incremental Validity of Language-Based Assessments of Personality in World Trade Center Responders

Identifier:nobleid.org/w1/20260515/77F05DFB

Type:Journal Article

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Incremental Validity of Language-Based Assessments of Personality in World Trade Center Responders

Identifier:nobleid.org/w1/20260515/77F05DFB

Type:Journal Article

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