Measurements of radioactive contaminants in semiconductor materials | NobleID

Main

Mint Work Search Explore Works Knowledge Graph Citation Graph Bibliometrics Receipts

v1

Measurements of radioactive contaminants in semiconductor materials

Identifier:nobleid.org/w1/20260515/8EF1D545

Type:Journal Article

0 views

Support unavailableClaim Your Authorship

View Original Paper Source

Embeddable Badge

[![NobleID](https://www.nobleid.org/api/badge/8EF1D545.svg?ark=w1%2F20260515%2F8EF1D545)](https://nobleid.org/work/w1/20260515/8EF1D545)

ARK Inflections

Metadata Policy

Metadata Formats

Bibliometric Analysis

Impact metrics, research fronts, co-authorship networks →

Authors & Claims

Paper Authors

Michael S. Gordon

Kenneth P. Rodbell

Conal E. Murray

Brendan D. McNally

Claim authorship of this work

info@nobleid.org

About FAQ Terms Policy Persistence & Resolver Service Policy