Theoretical analysis of T-stress effects on photoelastic fringe patterns in cracks | NobleID

Knowledge Graph Citation Graph Docs

Main

Mint Work Search Explore Works Knowledge Graph Citation Graph Bibliometrics Receipts

v1

Theoretical analysis of T-stress effects on photoelastic fringe patterns in cracks

Identifier:nobleid.org/w1/20260515/AE8EB331

Type:Journal Article

0 views

Support unavailableClaim Your Authorship

View Original Paper Source

Embeddable Badge

[![NobleID](https://www.nobleid.org/api/badge/AE8EB331.svg?ark=w1%2F20260515%2FAE8EB331)](https://nobleid.org/work/w1/20260515/AE8EB331)

ARK Inflections

Metadata Policy

Metadata Formats

Bibliometric Analysis

Impact metrics, research fronts, co-authorship networks →

Authors & Claims

Paper Authors

Zhenkun Lei Hai Yun

Claim authorship of this work

info@nobleid.org

About Terms Policy Persistence & Resolver Service Policy Pricing