회로팩의 온도가속 수명시험에 관한 고찰 | NobleID

Main

Mint Work Search Explore Works Knowledge Graph Citation Graph Bibliometrics Receipts

v1

회로팩의 온도가속 수명시험에 관한 고찰

Identifier:nobleid.org/w1/20260515/AFB457C6

Type:Journal Article

0 views

Support unavailableClaim Your Authorship

View Original Paper Source

Embeddable Badge

[![NobleID](https://www.nobleid.org/api/badge/AFB457C6.svg?ark=w1%2F20260515%2FAFB457C6)](https://nobleid.org/work/w1/20260515/AFB457C6)

ARK Inflections

Metadata Policy

Metadata Formats

Bibliometric Analysis

Impact metrics, research fronts, co-authorship networks →

Authors & Claims

Paper Authors

Chung-Ryeol Yang

Claim authorship of this work

info@nobleid.org

About FAQ Terms Policy Persistence & Resolver Service Policy