Behavior of shallow acceptor impurities in uniaxially stressed silicon and in synthetic diamond studied by

T. N. Mamedov; D. Andreika; A. S. Baturin; D. Herlach; V. N. Gorelkin; K. I. Gritsaj; Victor Ralchenko; A. Stoykov; V. A. Zhukov; U. Zimmermann

doi:10.1016/j.physb.2005.11.110

Behavior of shallow acceptor impurities in uniaxially stressed silicon and in synthetic diamond studied by

Identifier:nobleid.org/w1/20260515/BDF98A39

Type:Journal Article

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Behavior of shallow acceptor impurities in uniaxially stressed silicon and in synthetic diamond studied by

Identifier:nobleid.org/w1/20260515/BDF98A39

Type:Journal Article

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