v1
Defect pair creation through ultraviolet radiation in dense, amorphous SiO2.
Identifier:nobleid.org/w1/20260515/C1CB45FD
Type:Journal Article
0 views
Embeddable Badge
[](https://nobleid.org/work/w1/20260515/C1CB45FD)
Bibliometric Analysis
Impact metrics, research fronts, co-authorship networks →
Authors & Claims