v1
A sparse grid based spectral stochastic collocation method for variations-aware capacitance extraction of interconnects under nanometer process technology
Identifier:nobleid.org/w1/20260515/CD5FB98F
Type:Journal Article
0 views
Embeddable Badge
[](https://nobleid.org/work/w1/20260515/CD5FB98F)
Bibliometric Analysis
Impact metrics, research fronts, co-authorship networks →
Authors & Claims