Development of multipurpose laboratory XIEES spectrometer and its application to surface XAFS analysis of Al2O3 films.

v1

Type:Journal Article

0 views

[![NobleID](https://www.nobleid.org/api/badge/CF4040C7.svg?ark=w1%2F20260515%2FCF4040C7)](https://nobleid.org/work/w1/20260515/CF4040C7)

ARK Inflections

Bibliometric Analysis

Impact metrics, research fronts, co-authorship networks →

Authors & Claims

Paper Authors