v1
Universal dephasing rate due to diluted Kondo impurities.
Identifier:nobleid.org/w1/20260515/D87B3FCE
Type:Journal Article
0 views
Embeddable Badge
[](https://nobleid.org/work/w1/20260515/D87B3FCE)
Bibliometric Analysis
Impact metrics, research fronts, co-authorship networks →
Authors & Claims