Convergent beam electron diffraction extinction distance measurements for quantitative analysis of si(1-x),Ge(x).

v1

Type:Journal Article

0 views

[![NobleID](https://www.nobleid.org/api/badge/DB37BFCB.svg?ark=w1%2F20260515%2FDB37BFCB&value=id)](https://nobleid.org/work/w1/20260515/DB37BFCB)

ARK Inflections

Bibliometric Analysis

Impact metrics, research fronts, co-authorship networks →

Authors & Claims

Paper Authors