BUILT-IN SELF TEST FOR DETECTING STUCK-AT-FAULTS IN CMOS COMBINATIONAL LOGIC ICS | NobleID

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BUILT-IN SELF TEST FOR DETECTING STUCK-AT-FAULTS IN CMOS COMBINATIONAL LOGIC ICS

Identifier:nobleid.org/w1/20260515/DF014A5C

Type:Journal Article

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Widianto Widianto

Nurhadi Nurhadi

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