v1
Sensitivity analysis of insulation state indicator in dependence of sampling rate and bit resolution to define hardware requirements
Identifier:nobleid.org/w1/20260515/E76FADCF
Type:Journal Article
0 views
Embeddable Badge
[](https://nobleid.org/work/w1/20260515/E76FADCF)
Bibliometric Analysis
Impact metrics, research fronts, co-authorship networks →
Authors & Claims