Deep Level Defect Transient Spectroscopy Analysis of 4H-SiC SBD and JBS Diodes | NobleID

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Deep Level Defect Transient Spectroscopy Analysis of 4H-SiC SBD and JBS Diodes

Identifier:nobleid.org/w1/20260515/EBEEEE5F

Type:Journal Article

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Myeong-Cheol Shin

Jeong Hyun Moon

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