Effects of electron-electron correlations on defect and interface states in amorphous Si and SiO2 systems.

v1

Type:Journal Article

0 views

[![NobleID](https://www.nobleid.org/api/badge/EF0F1BAF.svg?ark=w1%2F20260515%2FEF0F1BAF)](https://nobleid.org/work/w1/20260515/EF0F1BAF)

ARK Inflections

Bibliometric Analysis

Impact metrics, research fronts, co-authorship networks →

Authors & Claims

Paper Authors