正向栅控二极管监测F-N电应力诱生的SOI-MOSFET界面陷阱 | NobleID

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正向栅控二极管监测F-N电应力诱生的SOI-MOSFET界面陷阱

Identifier:nobleid.org/w1/20260515/FC044FBD

Type:Journal Article

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