Probing strain and microstrain in nanostructured thin layers. | NobleID

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Probing strain and microstrain in nanostructured thin layers.

NobleID: NI1P64W40R02S24
Persistent link: https://nobleid.org/ark:/48914/w1/20260515/FDEE8D57

Type:Conference Paper

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Gianguido Baldinozzi

Dominique Gosset

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