Hot Hole-Induced Device Degradation by Drain Junction Reverse Current | NobleID

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Hot Hole-Induced Device Degradation by Drain Junction Reverse Current

NobleID: NI3P75W02R38S66
Persistent link: https://nobleid.org/ark:/48914/w1/20260515/FE30F976

Type:Journal Article

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Byoungdeog Choi

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