In-situ HVEM study of dopant dependent (113)-defect generation in silicon during 1-MeV electron irradiation.

v1

Type:Journal Article

0 views

[![NobleID](https://www.nobleid.org/api/badge/FFC1F048.svg?ark=w1%2F20260515%2FFFC1F048&value=id)](https://nobleid.org/work/w1/20260515/FFC1F048)

ARK Inflections

Bibliometric Analysis

Impact metrics, research fronts, co-authorship networks →

Authors & Claims

Paper Authors