High-resolution TEM and the application of direct and indirect aberration correction. | NobleID

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High-resolution TEM and the application of direct and indirect aberration correction.

Identifier:nobleid.org/w1/20260515/FFF0EE06

Type:Journal Article

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Crispin J D Hetherington

Lan-Yun Shery Chang

Peter D Nellist

Lionel Cervera Gontard

Rafal E Dunin-Borkowski

Angus I Kirkland

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