Thickness-dependent electron mobility of single and few-layer MoS2 thin-film transistors

v1

Type:Journal Article

0 views

[![NobleID](https://www.nobleid.org/api/badge/16FD503C.svg?ark=w1%2F20260516%2F16FD503C&value=id)](https://nobleid.org/work/w1/20260516/16FD503C)

ARK Inflections

Bibliometric Analysis

Impact metrics, research fronts, co-authorship networks →

Authors & Claims

Paper Authors