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Thickness and Conductivity of Metallic Layers from Pulsed Eddy Current Measurements | NobleID

v1

Thickness and Conductivity of Metallic Layers from Pulsed Eddy Current Measurements

Cheng‐Chi Tai, James H. Rose, J. C. Moulder

CT

Cheng‐Chi Tai

NobleIDNI3P15W29R23S00

Type:Journal Article

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