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SEU testing of a novel hardened register implemented using standard CMOS technology | NobleID

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SEU testing of a novel hardened register implemented using standard CMOS technology

Thierry Monnier, F.M. Roche, J. Cosculluela, Raoul Velazco

TM

Thierry Monnier

NobleIDNI5P69W84R51S17

Type:Journal Article

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