v1
Focused ion beam implantation of Ga in InP studied by SIMS and dynamic computer simulations
NobleIDNI9P30W36R91S76
Type:Journal Article
0 views
Embeddable Badge
[](https://nobleid.org/work/w1/20260521/7FDCE451)
ARK Inflections
Metadata Formats
Bibliometric Analysis
Impact metrics, research fronts, co-authorship networks →
Authors & Claims
Paper Authors