Main

Mint Work Search Explore Works Knowledge Graph Citation Graph Bibliometrics Receipts

info@nobleid.org

About Fund our work FAQ Developers Terms Policy Persistence & Resolver Service Policy

Dielectric loss as a parameter for the study of polymorphism in trierucin | NobleID

v1

Dielectric loss as a parameter for the study of polymorphism in trierucin

S. Parkash, J. M. V. Blanshard

SP

S. Parkash

NobleIDNI4P56W41R46S77

Type:Journal Article

Claim Your Authorship

Sign in to see the full record

Creating an account is free.

Create an account

For data access, contact info@nobleid.org.