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Research on High Frequency Current Measurement Method for the SiC MOSFET | NobleID

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Research on High Frequency Current Measurement Method for the SiC MOSFET

Shuai Liang, Yuming Liu, Chunhui Miao, Ke Sun

SL

Shuai Liang

NobleIDNI2P08W46R52S61

Type:Journal Article

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