v1
Limits of the ratios of tracer diffusivities for diffusion by vacancy pairs: Application to compound semiconductors
NobleIDNI7P11W35R31S91
Type:Journal Article
0 views
Embeddable Badge
[](https://nobleid.org/work/w1/20260521/D033AF71)
ARK Inflections
Metadata Formats
Bibliometric Analysis
Impact metrics, research fronts, co-authorship networks →
Authors & Claims