Physical Mechanism of Enhanced Uniaxial Stress Effect on Carrier Mobility in ETSOI MOSFETs

v1

Type:Journal Article

0 views

[![NobleID](https://www.nobleid.org/api/badge/DBFCAF28.svg?ark=w1%2F20260521%2FDBFCAF28&value=id)](https://nobleid.org/work/w1/20260521/DBFCAF28)

ARK Inflections

Bibliometric Analysis

Impact metrics, research fronts, co-authorship networks →

Authors & Claims

Paper Authors