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Embedding techniques for irradiation-induced defects in crystalline SiO/sub 2/ | NobleID

v1

Embedding techniques for irradiation-induced defects in crystalline SiO/sub 2/

A.H. Edwards, P.V. Sushko, A.L. Shluger, V.B. Sulimov

AE

A.H. Edwards

NobleIDNI8P28W87R87S66

Type:Journal Article

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