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Fast RF-CV Characterization Through High-Speed 1-port S-Parameter Measurements | NobleID

v1

Fast RF-CV Characterization Through High-Speed 1-port S-Parameter Measurements

R.W. Herfst, Peter G. Steeneken, M.P.J. Tiggelman, J. Stulemeijer, Jurriaan Schmitz

RH

R.W. Herfst

NobleIDNI4P99W23R36S47

Type:Journal Article

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