v1
IECON 2012 - 38th Annual Conference on IEEE Industrial Electronics Society
NobleIDNI8P53W19R93S94
Type:Journal Article
0 views
Embeddable Badge
[](https://nobleid.org/work/w1/20260521/F5DFAAA2)
ARK Inflections
Metadata Formats
Bibliometric Analysis
Impact metrics, research fronts, co-authorship networks →
Authors & Claims
Paper Authors