A review of sample thickness effects on high-resolution transmission electron microscopy imaging.

v1

Type:Journal Article

0 views

[![NobleID](https://www.nobleid.org/api/badge/393D5B35.svg?ark=w1%2F20260522%2F393D5B35&value=id)](https://nobleid.org/work/w1/20260522/393D5B35)

ARK Inflections

Bibliometric Analysis

Impact metrics, research fronts, co-authorship networks →

Authors & Claims

Paper Authors