Integrating Test Levels for Embedded Systems | NobleID

Main

Mint Work Search Explore Works Knowledge Graph Citation Graph Bibliometrics Receipts

v1

Integrating Test Levels for Embedded Systems

Identifier:nobleid.org/w1/20260523/532005AC

Type:Journal Article

0 views

Support unavailableClaim Your Authorship

Embeddable Badge

[![NobleID](https://www.nobleid.org/api/badge/532005AC.svg?ark=w1%2F20260523%2F532005AC)](https://nobleid.org/work/w1/20260523/532005AC)

ARK Inflections

Metadata Policy

Metadata Formats

Bibliometric Analysis

Impact metrics, research fronts, co-authorship networks →

Authors & Claims

Paper Authors

Abel Marrero Pérez

Claim authorship of this work

info@nobleid.org

About FAQ Terms Policy Persistence & Resolver Service Policy