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Measurement of n and k in the XUV by the Angle-of-Incidence, Total-External-Reflectance Method | NobleID
v1
Measurement of n and k in the XUV by the Angle-of-Incidence, Total-External-Reflectance Method
Marion L. Scott
MS
Marion L. Scott
NobleID
NI0P06W79R21S85
Type:
Journal Article
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