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Identification of the 0.15 eV Donor Defect in Bulk GaAs | NobleID

v1

Identification of the 0.15 eV Donor Defect in Bulk GaAs

Z. Fang, J. Hemsky, D. Look

ZF

Z. Fang

NobleIDNI9P09W92R35S66

Type:Journal Article

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