Dislocation emission from cracks-observations by x-ray topography in silicon

v1

[{'name': 'G. Michot', 'orcid': '0000-0002-3962-1897', 'country': None, 'affiliation': 'Institut National Polytechnique de Lorraine'} and 4 more

[{'name': 'G. Michot'

Type:article

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